Graduate Aptitude Test in Engineering (GATE) is an all India examination administered and conducted jointly by the Indian Institute of Science and seven Indian Institutes of Technology on behalf of the National Coordination Board - GATE, Department of Higher Education, Ministry of Human Resource Development (MHRD), Government of India.
The GATE committee, which comprises of representatives from the administering institutes, is the sole authority for regulating the examination and declaring the results.
GATE is conducted through the constitution of eight zones. The zones and the corresponding administrative institutes are:
Zone-1: Indian Institute of Science Bangalore
Zone-2: Indian Institute of Technology Bombay
Zone-3: Indian Institute of Technology Delhi
Zone-4: Indian Institute of Technology Guwahati
Zone-5: Indian Institute of Technology Kanpur
Zone-6: Indian Institute of Technology Kharagpur
Zone-7: Indian Institute of Technology Madras
Zone-8: Indian Institute of Technology Roorkee
GATE is conducted through the constitution of eight zones. The zones and the corresponding administrative institutes are:
Zone-1: Indian Institute of Science Bangalore
Zone-2: Indian Institute of Technology Bombay
Zone-3: Indian Institute of Technology Delhi
Zone-4: Indian Institute of Technology Guwahati
Zone-5: Indian Institute of Technology Kanpur
Zone-6: Indian Institute of Technology Kharagpur
Zone-7: Indian Institute of Technology Madras
Zone-8: Indian Institute of Technology Roorkee
The overall coordination and responsibility of conducting GATE 2011 lies with Indian Institute of Technology Madras,designated as the Organising Institute for GATE 2011 .
Admission to postgraduate programmes with MHRD and some other Government scholarships/assistantships in engineering colleges/institutes is open to those who qualify in GATE examination. GATE qualified candidates with Bachelor's degree in Engineering/Technology/Architecture or Master's degree in any branch of Science/Mathematics/Statistics/Computer Applications are eligible for admission to Master's degree programmes in Engineering/Technology/Architecture as well as for Doctoral programmes in relevant branches of Science with MHRD or other government scholarships/assistantships. To avail the scholarship, the candidate must secure admission to such a postgraduate programme, as per the prevailing procedure of the admitting institution. However, candidates with Master's degree in Engineering/Technology/Architecture may seek admission to relevant Doctoral programmes with scholarship/assistantship without appearing in the GATE examination.
GATE qualification is also a minimum requirement to apply for various fellowships awarded by many Government organizations.
ELIGIBILITY FOR GATE EXAMINATION
The following categories of candidates are eligible to appear for GATE:
- Bachelor's degree holders in Engineering/Technology/Architecture (4 years after 10+2) and those who are in the final or pre-final year of such programmes.
- Master's degree holders in any branch of Science/Mathematics/Statistics/Computer Applications or equivalent and those who are in the final or pre-final year of such programmes.
- Candidates in the second or higher year of the Four-year Integrated Master's degree programme (Post-B.Sc.) in Engineering/Technology or in the third or higher year of Five-year Integrated Master's degree programme and Dual Degree programme in Engineering/Technology.
- Candidates with qualifications obtained through examinations conducted by professional societies recognized by UPSC/AICTE (e.g. AMIE by IE(I), AMICE(I) by the Institute of Civil Engineers (India)-ICE(I)) as equivalent to B.E./B.Tech. Those who have completed section A or equivalent of such professional courses are also eligible.
POSTGRADUATE ADMISSIONS WITH MHRD SCHOLARSHIP
As per the directives of the MHRD, the following procedure is to be adopted for admission to postgraduate programmes (Master and Doctoral) with MHRD scholarship/assistantship. The performance of the candidate in GATE will be considered for admission. If the candidate is to be selected through interview for postgraduate programmes, minimum 70% weightage is to be given to the performance in GATE. The remaining weightage (30% maximum) can be given to the candidate's academic record or performance in interview. Candidate opting for a general paper (XE or XL) may be further examined (by interview/written test) by the admitting institution. In such cases also the weightage for performance in GATE should not be less than 70%. The admitting institution will prescribe minimum passing percentage of marks in the interview. Some colleges/institutes specify GATE qualification as the mandatory requirement even for admission without MHRD scholarship/assistantship.
Candidates are advised to seek details of admission procedures and availability of MHRD scholarship/assistantship from the concerned admitting institution. The criteria for postgraduate admission with scholarship/assistantship are different for different admitting institutions. GATE offices will not entertain any enquiry about admission and award of scholarship/assistantship.
It is the responsibility of the admitting institution to award the MHRD scholarship/assistantship to only those candidates who secured marks equal to or more than the "qualifying mark" in the concerned GATE paper and for the corresponding category of the candidate . The management of the postgraduate scholarship/assistantship is also the responsibility of the admitting institution. The GATE committee also has no role in the award or disbursement of scholarship/assistantship. Similarly, reservation of seats under different categories is as per the policies and norms prevailing at the admitting institution and Government of India rules.
A candidate declared "GATE qualified at the time of admission" is entitled for MHRD fellowship for 24 months unless he/she loses it due to poor performance in the registered programme.
The students of Integrated Master Degree and Dual Degree programmes in Engineering/Technology are eligible to appear in GATE 2011 in order to qualify for the postgraduate scholarships in their own institutions only. They are not eligible for admission to a fresh M.E./M.Tech. programme.
SYLLABUS FOR ELECTRONICS AND COMMUNICATION ENGINEERING (EC)
Engineering Mathematics
Linear Algebra:
Matrix Algebra, Systems of linear equations, Eigen values and eigen vectors.
Calculus:
Mean value theorems, Theorems of integral calculus, Evaluation of definite and improper integrals, Partial Derivatives, Maxima and minima, Multiple integrals, Fourier series. Vector identities, Directional derivatives, Line, Surface and Volume integrals, Stokes, Gauss and Green's theorems.
Differential equations:
First order equation (linear and nonlinear), Higher order linear differential equations with constant coefficients, Method of variation of parameters, Cauchy's and Euler's equations, Initial and boundary value problems, Partial Differential Equations and variable separable method.
Complex variables:
Analytic functions, Cauchy's integral theorem and integral formula, Taylor's and Laurent' series, Residue theorem, solution integrals.
Probability and Statistics:
Sampling theorems, Conditional probability, Mean, median, mode and standard deviation, Random variables, Discrete and continuous distributions, Poisson, Normal and Binomial distribution, Correlation and regression analysis.
Numerical Methods:
Solutions of non-linear algebraic equations, single and multi-step methods for differential equations.
Transform Theory:
Fourier transform, Laplace transform, Z-transform.
Electronics And Communication Engineering
Networks:
Network graphs: matrices associated with graphs; incidence, fundamental cut set and fundamental circuit matrices. Solution methods: nodal and mesh analysis. Network theorems: superposition, Thevenin and Norton's maximum power transfer, Wye-Delta transformation. Steady state sinusoidal analysis using phasors. Linear constant coefficient differential equations; time domain analysis of simple RLC circuits, Solution of network equations using Laplace transform: frequency domain analysis of RLC circuits. 2-port network parameters: driving point and transfer functions. State equations for networks.
Electronic Devices:
Energy bands in silicon, intrinsic and extrinsic silicon. Carrier transport in silicon: diffusion current, drift current, mobility, and resistivity. Generation and recombination of carriers. p-n junction diode, Zener diode, tunnel diode, BJT, JFET, MOS capacitor, MOSFET, LED, p-I-n and avalanche photo diode, Basics of LASERs. Device technology: integrated circuits fabrication process, oxidation, diffusion, ion implantation, photolithography, n-tub, p-tub and twin-tub CMOS process.
Analog Circuits:
Small Signal Equivalent circuits of diodes, BJTs, MOSFETs and analog CMOS. Simple diode circuits, clipping, clamping, rectifier. Biasing and bias stability of transistor and FET amplifiers. Amplifiers: single-and multi-stage, differential and operational, feedback, and power. Frequency response of amplifiers. Simple op-amp circuits. Filters. Sinusoidal oscillators; criterion for oscillation; single-transistor and op-amp configurations. Function generators and wave-shaping circuits, 555 Timers. Power supplies.
Digital circuits:
Boolean algebra, minimization of Boolean functions; logic gates; digital IC families (DTL, TTL, ECL, MOS, CMOS). Combinatorial circuits: arithmetic circuits, code converters, multiplexers, decoders, PROMs and PLAs. Sequential circuits: latches and flip-flops, counters and shift-registers. Sample and hold circuits, ADCs, DACs. Semiconductor memories. Microprocessor(8085): architecture, programming, memory and I/O interfacing.
Signals and Systems:
Definitions and properties of Laplace transform, continuous-time and discrete-time Fourier series, continuous-time and discrete-time Fourier Transform, DFT and FFT, z-transform. Sampling theorem. Linear Time-Invariant (LTI) Systems: definitions and properties; causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, frequency response, group delay, phase delay. Signal transmission through LTI systems.
Control Systems:
Basic control system components; block diagrammatic description, reduction of block diagrams. Open loop and closed loop (feedback) systems and stability analysis of these systems. Signal flow graphs and their use in determining transfer functions of systems; transient and steady state analysis of LTI control systems and frequency response. Tools and techniques for LTI control system analysis: root loci, Routh-Hurwitz criterion, Bode and Nyquist plots. Control system compensators: elements of lead and lag compensation, elements of Proportional-Integral-Derivative (PID) control. State variable representation and solution of state equation of LTI control systems.
Communications:
Random signals and noise: probability, random variables, probability density function, autocorrelation, power spectral density. Analog communication systems: amplitude and angle modulation and demodulation systems, spectral analysis of these operations, superheterodyne receivers; elements of hardware, realizations of analog communication systems; signal-to-noise ratio (SNR) calculations for amplitude modulation (AM) and frequency modulation (FM) for low noise conditions. Fundamentals of information theory and channel capacity theorem. Digital communication systems: pulse code modulation (PCM), differential pulse code modulation (DPCM), digital modulation schemes: amplitude, phase and frequency shift keying schemes (ASK, PSK, FSK), matched filter receivers, bandwidth consideration and probability of error calculations for these schemes. Basics of TDMA, FDMA and CDMA and GSM.
Electromagnetics:
Elements of vector calculus: divergence and curl; Gauss' and Stokes' theorems, Maxwell's equations: differential and integral forms. Wave equation, Poynting vector. Plane waves: propagation through various media; reflection and refraction; phase and group velocity; skin depth. Transmission lines: characteristic impedance; impedance transformation; Smith chart; impedance matching; S parameters, pulse excitation. Waveguides: modes in rectangular waveguides; boundary conditions; cut-off frequencies; dispersion relations. Basics of propagation in dielectric waveguide and optical fibers. Basics of Antennas: Dipole antennas; radiation pattern; antenna gain.
SYLLABUS FOR INSTRUMENTATION ENGINEERING (IN)
Engineering Mathematics
Linear Algebra:
Matrix Algebra, Systems of linear equations, Eigen values and eigen vectors.
Calculus:
Mean value theorems, Theorems of integral calculus, Evaluation of definite and improper integrals, Partial Derivatives, Maxima and minima, Multiple integrals, Fourier series. Vector identities, Directional derivatives, Line, Surface and Volume integrals, Stokes, Gauss and Green's theorems.
Differential equations:
First order equation (linear and nonlinear), Higher order linear differential equations with constant coefficients, Method of variation of parameters, Cauchy's and Euler's equations, Initial and boundary value problems, Partial Differential Equations and variable separable method.
Complex variables:
Analytic functions, Cauchy's integral theorem and integral formula, Taylor's and Laurent' series, Residue theorem, solution integrals.
Probability and Statistics:
Sampling theorems, Conditional probability, Mean, median, mode and standard deviation, Random variables, Discrete and continuous distributions, Poisson, Normal and Binomial distribution, Correlation and regression analysis.
Numerical Methods:
Solutions of non-linear algebraic equations, single and multi-step methods for differential equations.
Transform Theory:
Fourier transform, Laplace transform, Z-transform.
Instrumentation Engineering
Basics of Circuits and Measurement Systems:
Kirchoff's laws, mesh and nodal Analysis. Circuit theorems. One-port and two-port Network Functions. Static and dynamic characteristics of Measurement Systems. Error and uncertainty analysis. Statistical analysis of data and curve fitting.
Transducers, Mechanical Measurement and Industrial Instrumentation:
Resistive, Capacitive, Inductive and piezoelectric transducers and their signal conditioning. Measurement of displacement, velocity and acceleration (translational and rotational), force, torque, vibration and shock. Measurement of pressure, flow, temperature and liquid level. Measurement of pH, conductivity, viscosity and humidity.
Analog Electronics:
Characteristics of diode, BJT, JFET and MOSFET. Diode circuits. Transistors at low and high frequencies, Amplifiers, single and multi-stage. Feedback amplifiers. Operational amplifiers, characteristics and circuit configurations. Instrumentation amplifier. Precision rectifier. V-to-I and I-to-V converter. Op-Amp based active filters. Oscillators and signal generators.
Digital Electronics:
Combinational logic circuits, minimization of Boolean functions. IC families, TTL, MOS and CMOS. Arithmetic circuits. Comparators, Schmitt trigger, timers and mono-stable multi-vibrator. Sequential circuits, flip-flops, counters, shift registers. Multiplexer, S/H circuit. Analog-to-Digital and Digital-to-Analog converters. Basics of number system. Microprocessor applications, memory and input-output interfacing. Microcontrollers.
Signals, Systems and Communications:
Periodic and aperiodic signals. Impulse response, transfer function and frequency response of first- and second order systems. Convolution, correlation and characteristics of linear time invariant systems. Discrete time system, impulse and frequency response. Pulse transfer function. IIR and FIR filters. Amplitude and frequency modulation and demodulation. Sampling theorem, pulse code modulation. Frequency and time division multiplexing. Amplitude shift keying, frequency shift keying and pulse shift keying for digital modulation.
Electrical and Electronic Measurements:
Bridges and potentiometers, measurement of R,L and C. Measurements of voltage, current, power, power factor and energy. A.C & D.C current probes. Extension of instrument ranges. Q-meter and waveform analyzer. Digital voltmeter and multi-meter. Time, phase and frequency measurements. Cathode ray oscilloscope. Serial and parallel communication. Shielding and grounding.
Control Systems and Process Control:
Feedback principles. Signal flow graphs. Transient Response, steady-state-errors. Routh and Nyquist criteria. Bode plot, root loci. Time delay systems. Phase and gain margin. State space representation of systems. Mechanical, hydraulic and pneumatic system components. Synchro pair, servo and step motors. On-off, cascade, P, P-I, P-I-D, feed forward and derivative controller, Fuzzy controllers.
Analytical, Optical and Biomedical Instrumentation:
Mass spectrometry. UV, visible and IR spectrometry. X-ray and nuclear radiation measurements. Optical sources and detectors, LED, laser, Photo-diode, photo-resistor and their characteristics. Interferometers, applications in metrology. Basics of fiber optics. Biomedical instruments, EEG, ECG and EMG. Clinical measurements. Ultrasonic transducers and Ultrasonography. Principles of Computer Assisted Tomography.
All the best for your Gate Examination
